Fast optimization schemes for feature selection in analog circuits fault diagnosis
نویسندگان
چکیده
The aim of this work is to systematize the knowledge resulting from research on the impact of the feature selection on the quality of diagnostic procedures in the diagnosis of nonlinear systems. Particular attention was devoted to the selection of appropriate comparative criteria and optimization algorithms necessary for the selection of defects in the studied nonlinear systems, so that the inclusion of the elements in the process of detection and location of single and multiple catastrophic failures is possible to the highest degree. Basing on the research and simulations results, the fast, “low-costs” method for feature selection using new data quality indexes was invented and tested on real circuits examples. Streszczenie. Celem pracy jest usystematyzowanie wiedzy wynikającej z badań realnego wpływu selekcji cech na jakość procedur wykrywania uszkodzeń w diagnostyce układów nieliniowych. Szczególna uwaga została poświęcona na dobór właściwych kryteriów porównawczych i algorytmów optymalizacyjnych niezbędnych w procesie wyboru atrybutów uszkodzeń badanych układów nieliniowych tak, aby w jak największym stopniu możliwe było uwzględnienie tolerancji elementów w procesie detekcji i lokalizacji jednokrotnych i wielokrotnych uszkodzeń katastroficznych. Opierając się na wynikach analiz i symulacji opracowano i przetestowano na przykładach, szybki w działaniu algorytm selekcji cech wykorzystujący nowe indeksy oceny jakości zbioru danych. (Prosta optymalizacja procesu selekcji cech w diagnostyce układów analogowych).
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